Title :
Quantitative understanding of the mated interface characteristics of precision coaxial connectors at microwave and millimeter-wave frequencies
Author :
Horibe, Masahiro ; Shida, Masaaki ; Komiyama, Koji
Author_Institution :
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, 305-8563, Japan
Abstract :
This paper is investigation of inter-mate ability of precision coaxial connectors for the mated interface made of connectors produced by different manufacturers. The connectors were usually designed on the basis of IEEE or IEC standards, however, dimensions of the female socket and male pin vary by manufacturer. As a result, the different reflection characteristics generated around the mated interfaces depend on the combination of connectors supplied by different manufacturers. This investigation is based on dimensional assessment and further time-domain reflection measurement. The paper includes an analysis and discussion of the influence of connector mated interface to the measurements using vector network analyzers.
Keywords :
electric connectors; microwave measurement; time-domain reflectometry; connector mated interface; precision coaxial connectors; reflection characteristics; vector network analyzer; Coaxial components; Conductors; Connectors; Frequency; Manufacturing; Metrology; Optical reflection; Sockets; Time domain analysis; Time measurement; Dimensional measurements; Inter-mateability; Precision coaxial connectors; Time-domain network analysis;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633316