Title :
On-chip cancellation of parasitic effects for dielectric permittivity measurement
Author :
Song, Chunrong ; Wang, Pingshan
Author_Institution :
Electrical and Computer Engineering Dept. at Clemson University, SC, 29634, USA
Abstract :
A new approach for parasitic effects cancellation is proposed, analyzed, and experimentally evaluated. The method exploits the symmetry of the proposed test structures. It greatly improves measurement sensitivity for small dielectric permittivity changes. The experimental results agree well with theoretical and simulation results.
Keywords :
S-parameters; microwave detectors; permittivity; power dividers; transmission lines; dielectric permittivity measurement; measurement sensitivity; microwave measurements; parasitic effects on-chip cancellation; test structures. symmetry; Calibration; Dielectric measurements; Frequency measurement; Integrated circuit measurements; Permittivity measurement; Planar transmission lines; Power dividers; Scattering parameters; Testing; Transmission line measurements; Planar transmission lines; power dividers; scattering parameters; sensitivity; sensors;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633317
