DocumentCode
2948982
Title
On-chip cancellation of parasitic effects for dielectric permittivity measurement
Author
Song, Chunrong ; Wang, Pingshan
Author_Institution
Electrical and Computer Engineering Dept. at Clemson University, SC, 29634, USA
fYear
2008
fDate
15-20 June 2008
Firstpage
131
Lastpage
134
Abstract
A new approach for parasitic effects cancellation is proposed, analyzed, and experimentally evaluated. The method exploits the symmetry of the proposed test structures. It greatly improves measurement sensitivity for small dielectric permittivity changes. The experimental results agree well with theoretical and simulation results.
Keywords
S-parameters; microwave detectors; permittivity; power dividers; transmission lines; dielectric permittivity measurement; measurement sensitivity; microwave measurements; parasitic effects on-chip cancellation; test structures. symmetry; Calibration; Dielectric measurements; Frequency measurement; Integrated circuit measurements; Permittivity measurement; Planar transmission lines; Power dividers; Scattering parameters; Testing; Transmission line measurements; Planar transmission lines; power dividers; scattering parameters; sensitivity; sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location
Atlanta, GA
ISSN
0149-645X
Print_ISBN
978-1-4244-1780-3
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2008.4633317
Filename
4633317
Link To Document