Title :
Thermo-mechanical modeling of a novel MCM-DL technology
Author :
Dunne, Rajiv C. ; Sitaraman, Suresh K.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents parametric studies to assess the thermomechanical reliability of a novel “sandwich” substrate with integrated passives under thermal shock testing. A thermoelastic-plastic finite element analysis is done where FR4 is treated as elastic and orthotropic (with temperature-dependent material properties), and the dielectric polymer and Copper are treated as bilinear elastic-plastic materials. The effect of some geometric and material parameters-FR4 base layer height and insulating layer material-on board warpage and the thermal stress/strain field is discussed, and design guidelines for improved thermo-mechanical integrity of the substrate are suggested
Keywords :
circuit reliability; finite element analysis; integrated circuit packaging; multichip modules; thermal shock; FR4; MCM-DL technology; base layer height; bilinear elastic-plastic materials; board warpage; dielectric polymer; geometric parameters; insulating layer material; integrated passives; sandwich substrate; temperature-dependent material properties; thermal shock testing; thermo-mechanical modeling; thermoelastic-plastic finite element analysis; thermomechanical reliability; Dielectric materials; Dielectric substrates; Electric shock; Finite element methods; Material properties; Parametric study; Testing; Thermal stresses; Thermoelasticity; Thermomechanical processes;
Conference_Titel :
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3286-5
DOI :
10.1109/ECTC.1996.550502