DocumentCode :
2949811
Title :
Magnetic and transport properties revealing a structural percolation in Ni81Fe19-Al2O3 multilayers
Author :
Rimantas, B. ; Maj, H.
Author_Institution :
Chalmers Univ. of Technol., Goteborg
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
937
Lastpage :
937
Abstract :
This study presents the structural, magnetic and transport properties of a series of Ni81Fe19-Al2O3 granular multilayer films. The multilayers were prepared by sequential deposition of Ni81Fe19 (Permalloy, Py) and Al2O3 on thermally oxidized Si(001) substrates by DC and RF sputtering, respectively. The thickness t of the Al2O3 layers was kept constant at 16 , while the nominal thickness of the Py layers was varied in the range from 8 to 16 . Low-angle X-ray reflectivity (XRR) measurements and alternating gradient magnetometry (AGM) at room temperature, in conjunction with variable temperature magneto-optical Kerr effect (MOKE) and measurements of temperature dependent electrical resistance were applied for evaluation of the structural and magnetic properties of the multilayers. Results show that transition from ferro-to superparamagnetic behavior and from metallic to dielectric conductance imply a structural percolation, where the magnetic films change from forming continuous layers to particles as the Py layer thickness decreases from 16 to 10 .
Keywords :
Kerr magneto-optical effect; Permalloy; X-ray reflection; alumina; electrical resistivity; ferromagnetic materials; ferromagnetic-paramagnetic transitions; granular materials; magnetic multilayers; magnetic particles; magnetic thin films; metal-insulator transition; percolation; reflectivity; superparamagnetism; AGM; DC sputtering; MOKE; Ni81Fe19-Al2O3; RF sputtering; Si; XRR; alternating gradient magnetometry; continuous layer; electrical resistance; ferromagnetic-superparamagnetic transition; granular multilayer films; low-angle X-ray reflectivity; magnetic properties; magnetooptical Kerr effect; metallic-dielectric conductance transition; particulate media; size 8 A to 16 A; structural percolation; temperature 293 K to 298 K; thermally oxidized Si(001) substrate; transport property; Dielectric measurements; Electric variables measurement; Electrical resistance measurement; Iron; Magnetic films; Magnetic multilayers; Magnetic properties; Radio frequency; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.374968
Filename :
4262370
Link To Document :
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