Title :
Competing reversal mechanisms and edge roughness in thin micron-scale ferromagnetic ring elements
Author :
Hayward, T.J. ; Van Belle, F. ; Bland, J.
Author_Institution :
Cambridge Univ., Cambridge
Abstract :
The results of micromagnetic simulations which investigate the role of edge roughness in the switching behaviour of micrometer-scale permalloy rings is presented and show that the change in behaviour observed in thin elements can be explained by the effect the roughness has on the local spin dynamics of the ring.
Keywords :
Permalloy; ferromagnetic materials; magnetic domain walls; magnetic hysteresis; magnetic switching; spin dynamics; Ni80Fe20; Permalloy rings; domain walls; edge roughness; hysteresis loops; micromagnetic simulations; reversal mechanisms; spin dynamics; switching behaviour; thin micron-scale ferromagnetic ring elements; Geometry; Laboratories; Magnetic devices; Magnetic domain walls; Magnetic domains; Magnetic multilayers; Magnetic switching; Magnetization; Micromagnetics; Switches;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.374971
