DocumentCode :
2949896
Title :
Probing the magnetization reversal of microstructured permalloy cross by planar hall measurement and magnetic force microscopy
Author :
Chang, Y. ; Chang, C. ; Wu, J. ; Wei, Z. ; Chang, Carole
Author_Institution :
Taiwan SPIN Res. Center, Changhua
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
941
Lastpage :
941
Abstract :
In this paper, we investigate the magnetization reversal at the junction of a single layer microstructured permalloy cross via magnetoresistance measurement, planar Hall measurement, and magnetic force microscope (MFM). Magnetoresistance (MR) measurements were carried out with a nominal dc current introduced and the voltage drop measured across the longitudinal voltage pair under the magnetic field applied parallel/perpendicular to the current direction, whereas the planar Hall was studied with the same setup but the voltage drop was measured across the transverse Hall voltage pair. A transverse voltage measurement of permalloy cross in which the magnetization reversal process of arms induced the rotation of Mj, thus introducing a dramatic change of magnetic scattering correlated to transverse voltage.
Keywords :
Hall effect; Permalloy; magnetic force microscopy; magnetisation reversal; FeNi; magnetic force microscopy; magnetic scattering; magnetization reversal; permalloy; planar hall measurement; Arm; Current measurement; Force measurement; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetization reversal; Magnetoresistance; Scattering; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.374972
Filename :
4262374
Link To Document :
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