Fabrication of high-value standard resistors

Author

Dziuba, R.F. ; Jarrett, D.G. ; Scott, L.L. ; Secula, A.J.

Author_Institution

Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

fYear

1998

fDate

6-10 July 1998

Firstpage

309

Lastpage

310

Abstract

NIST has fabricated stable, transportable 10 M/spl Omega/ and 1 G/spl Omega/ standard resistors for use in an international comparison of high resistances. This fabrication process is being applied to the construction of standard resistors of values up to 100 T/spl Omega/, with initial results indicating significant improvements in stability and fewer adverse effects induced by mechanical shock and vibration.

Keywords

ageing; electric resistance measurement; glass-metal seals; heat treatment; measurement uncertainty; thin film resistors; transfer standards; 1 Gohm; 10 Mohm; 100 Tohm; fabrication; film-type resistors; glass-metal seals; heat treatment; hermetic sealing; high resistances; high-value standard resistors; improved stability; international comparison; pre-ageing; reduced shock effects; reduced vibration effects; transfer standards; transportable standard resistors; uncertainties; wirewound resistors; Assembly; Conductivity; Electric shock; Fabrication; NIST; Resistors; Stability; Surface resistance; Vibrations; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1998 Conference on

Conference_Location

Washington, DC, USA

Print_ISBN

0-7803-5018-9

Type

conf

DOI

10.1109/CPEM.1998.699924

Filename

699924