Effect of Oxygen Bombardment on Structural and Magnetic Properties of Ion-beam Deposited NiFe/Fe-oxide Bilayers

Author

Lin, K. ; Ko, P. ; Liu, C. ; Guo, Z. ; Van Lierop, J.

Author_Institution

Nat. Chung Hsing Univ., Taichung

fYear

2006

fDate

8-12 May 2006

Firstpage

950

Lastpage

950

Abstract

In this paper, the potential for new device materials and insight into the effects of some of the different iron oxide forms on exchange bias with NiFe (Permalloy) was discussed. The iron-oxides have significantly different magnetic properties. Thin film bilayers were deposited using a dual ion-beam deposition technique that produced an antiferromagnetic iron-oxide layer composition that ranged from Fe₃O₄ to Fe₂O₃. The crystal structures of the Fe-oxide films were characterized by X-ray diffractometry (XRD). A JEOL (JEM-2010) Transmission electron microscope (TEM) operating at 200 kV was used for microstructural analysis. The magnetic properties such as exchange coupling and magnetic hysteresis of these bilayers were characterized using a vibrating sample magnetometer (VSM) and a superconducting quantum interference device (SQUID) magnetometry.

Keywords

Permalloy; X-ray diffraction; antiferromagnetic materials; exchange interactions (electron); ferrimagnetic materials; ion beam assisted deposition; iron compounds; magnetic hysteresis; magnetic multilayers; transmission electron microscopy; NiFe-Fe₂O₃; NiFe-Fe₃O₄; Permalloy; SQUID; TEM; VSM; X-ray diffractometry; XRD; antiferromagnetic iron-oxide layer; crystal structures; exchange bias; exchange coupling; ion-beam deposited bilayers; magnetic hysteresis; magnetic properties; microstructural analysis; oxygen bombardment; superconducting quantum interference device magnetometry; thin film bilayers; transmission electron microscopy; vibrating sample magnetometer; voltage 200 V; Antiferromagnetic materials; Crystal microstructure; Iron; Magnetic films; Magnetic materials; Magnetic properties; Oxygen; SQUIDs; Sputtering; Superconducting films;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.374981

Filename

4262383