Superparamagnetic Transition in Diluted Exchange Coupled Bilayers

Author

Traistaru, O. ; Fujiwara, H.

Author_Institution

Alabama Univ., Tuscaloosa

fYear

2006

fDate

8-12 May 2006

Firstpage

951

Lastpage

951

Abstract

In ferromagnet (FM)/antiferromagnet (AF) bilayer systems, it was recently found that the exchange bias vs. FM thickness curve shows a critical thickness below which the exchange bias vanishes, and confirmed by analytic calculation using a simplified model that it can be ascribed to the superparamagnetism (SPM) promoted through the exchange coupling with the AF layer. This paper studies the effect by means of Monte Carlo simulations and tries to obtain more insight into the phenomenon. The AF layer is randomly diluted up to 0.3 at.% to account for the presence of defects contributing to the exchange bias effect. The influence of the FM dilution on the onset of SPM is investigated.

Keywords

Monte Carlo methods; antiferromagnetism; exchange interactions (electron); ferromagnetism; interface magnetism; magnetic transitions; superparamagnetism; FM dilution; Monte Carlo simulations; SPM; defects; diluted exchange coupled bilayers; exchange bias effect; ferromagnet-antiferromagnet bilayer system; randomly AF diluted layer; superparamagnetic transition; Anisotropic magnetoresistance; Antiferromagnetic materials; Atomic layer deposition; Elementary particle exchange interactions; Monte Carlo methods; Nearest neighbor searches; Remanence; Scanning probe microscopy; Shape; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.374982

Filename

4262384