• DocumentCode
    2950110
  • Title

    Interface Effects in Tri-layer IrMn Exchange Biased Systems

  • Author

    Huerrich, C. ; Dutson, J.D. ; Mao, S. ; Grady, K.O.

  • Author_Institution
    York Univ., York
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    953
  • Lastpage
    953
  • Abstract
    This work investigates interface and annealing effects in tri-layer IrMn exchange biased systems. Two samples have been studied with the same initial structure of SiSiO2NiCr(5 nm)CoFe(12 nm)IrMn(5 nm): Sample A had CoFe (8 nm) and sample B hadNiFe (10 nm). There was also an additional NiCr(5 nm) capping layer to prevent corrosion. The different thicknesses of the top layer and bottom layers of the tri-layer stack enables identification of each layer on the hysteresis loop. Samples were measured as prepared and after annealing at 200, 250 and 300degC for 4 hours in a saturating field of 1 kOe. This paper also discusses the separate effects of the interface and particularly the grain size distribution in the antiferromagnetic layer on both the exchange bias and coercivity.
  • Keywords
    annealing; antiferromagnetic materials; chromium alloys; cobalt alloys; coercive force; exchange interactions (electron); ferromagnetic materials; grain size; iridium alloys; iron alloys; magnetic hysteresis; magnetic multilayers; manganese alloys; nickel alloys; silicon; silicon compounds; Si-SiO2-NiCr-CoFe-IrMn; annealing; antiferromagnetic layer; coercivity; corrosion; exchange bias; grain size distribution; hysteresis loop; interface; temperature 200 degC; temperature 250 degC; temperature 300 degC; time 4 hour; tri-layer exchange biased systems; Annealing; Antiferromagnetic materials; Coercive force; Corrosion; Grain size; Magnetic field measurement; Magnetic hysteresis; Physics; Temperature measurement; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.374984
  • Filename
    4262386