Micron resolution in-depth reflectance measurements with SuperLuminescent Diode and photo-ElectroMotiveForce adaptive detector

Summary form only given. Earlier we have reported application of the photo-EMF based adaptive detectors for coherence measurements of the laser beams, including those reflected from rough surfaces. Later, application of this technique for laser profilometry of as-processed metal surfaces was experimentally demonstrated. Here we present for the first time, micron resolution monitoring of in-depth distribution of the reflectance i.e., another step to application of this technique to Optical Coherence Tomography.