DocumentCode :
295016
Title :
A bilevel control architecture for rapid magnet cycling
Author :
Bhukhanwala, Binal ; Chong, Edwin K P ; Elmore, David
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
2
fYear :
1995
fDate :
13-15 Dec 1995
Firstpage :
1726
Abstract :
Describes a bilevel controller architecture for rapid magnet cycling. The design of the controller is motivated by applications in accelerator mass spectrometry, where the command signal is typically piecewise constant and periodic. The controller consists of a low level component, which provides disturbance rejection, and a high level component, which provides tracking capability. The low level component is a conventional fuzzy controller that uses the output error and change of error to update the control signal at every sampling interval. The high level component updates the control signal at every cycle of the periodic command signal, using feedback from the previous cycle and a gradient algorithm. The authors present results from empirical studies, including a comparison of our bilevel controller with simpler conventional controllers
Keywords :
accelerator control systems; beam handling equipment; discrete time systems; electric current control; electric current measurement; feedback; fuzzy control; iterative methods; magnetic variables control; magnetic variables measurement; mass spectroscopy; optimisation; particle spectrometers; three-term control; accelerator mass spectrometry; bilevel control architecture; disturbance rejection; fuzzy controller; gradient algorithm; high level component; low level component; output error; periodic command signal; rapid magnet cycling; tracking; Atomic measurements; Computer architecture; Current measurement; Extraterrestrial measurements; Geologic measurements; Isotopes; Magnetic analysis; Magnetic field measurement; Magnetic separation; Magnetosphere;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 1995., Proceedings of the 34th IEEE Conference on
Conference_Location :
New Orleans, LA
ISSN :
0191-2216
Print_ISBN :
0-7803-2685-7
Type :
conf
DOI :
10.1109/CDC.1995.480389
Filename :
480389
Link To Document :
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