Title :
Correction of systematic effects in digitizing oscilloscopes
Author :
Bertocco, M. ; Garbin, L. ; Narduzzi, C.
Author_Institution :
Dipt. di Elettronica e Inf., Padova Univ., Italy
Abstract :
The paper presents a procedure to improve the accuracy of a digital sampling oscilloscope in the acquisition of complex waveforms. Using suitable calibration data, additive correction terms are calculated, and a criterion is given to determine when correction uncertainty is acceptable.
Keywords :
Fourier analysis; analogue-digital conversion; calibration; digital storage oscilloscopes; harmonic analysis; measurement uncertainty; wave analysers; Fourier-based method; accuracy improvement; acquisition of complex waveforms; additive correction terms; calibration data; correction algorithm; correction uncertainty; digital sampling oscilloscope; digitizing oscilloscopes; harmonic content; stochastic approach; systematic effects correction; waveform digitizer; Calibration; Fourier series; Frequency measurement; Gain measurement; Manufacturing; Oscilloscopes; Performance evaluation; Phase measurement; Sampling methods; Testing;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699927
