• DocumentCode
    2950714
  • Title

    A Curve Fitting Approach to Separation of Non-Linearly Separable Pattern Classes, Applied to Chromosome Classification

  • Author

    Vaidyanathan, S.G. ; Kar, Bibhas ; Kumaravel, N.

  • Author_Institution
    Sri Venkateswara Coll. of Eng., Sriperumbudur
  • fYear
    2008
  • fDate
    4-6 Jan. 2008
  • Firstpage
    359
  • Lastpage
    362
  • Abstract
    This paper proposes a new method by which we can arrive at a non-linear decision boundary that exists between two pattern classes that are non-linearly separable. Chromosomal identification is of prime importance to cytogeneticists for diagnosing various abnormalities. The classification of chromosomes using a classifier is generally difficult and inaccurate due to closeness of feature vectors belonging to various chromosome classes. In this paper a novel method to perform chromosomal classification has been attempted and a good classification accuracy of 94% has been achieved. The technique involves sampling of the feature space within an area bounded by the curves of best fit to the two pattern classes and arriving at the optimal boundary point between the two classes in each sampled region. The boundary points are then smoothened to obtain the non-linear decision boundary.
  • Keywords
    biology computing; cellular biophysics; curve fitting; pattern classification; sampling methods; chromosomal classification; chromosomal identification; chromosome classification; curve fitting approach; cytogeneticists; nonlinear decision boundary; nonlinearly separable pattern classes; sampling technique; Biological cells; Biomedical engineering; Curve fitting; Educational institutions; Genetic engineering; Hospitals; Sampling methods; Senior members; Signal processing; Testing; Binary pattern Classifier; Curve fitting; Feature space; Sampling; cubic spline curve;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing, Communications and Networking, 2008. ICSCN '08. International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4244-1924-1
  • Electronic_ISBN
    978-1-4244-1924-1
  • Type

    conf

  • DOI
    10.1109/ICSCN.2008.4447219
  • Filename
    4447219