DocumentCode :
2950920
Title :
Introduction to Noise and Measurement Techniques
Author :
Nowak, E.
Author_Institution :
Univ. of Delaware, Newark
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
1003
Lastpage :
1003
Abstract :
The major sources of noise in magnetoresistive systems will be discussed, including: thermal, shot, electronic, and magnetization noise. These noise mechanisms produce either voltage, current, or resistance fluctuations that limit the ultimate field sensitivity of magnetoresistive sensors. For high-bandwidth applications, thermal and shot noise can contribute significant integrated noise power owing to their frequency independent spectral content. For low frequency applications, resistance fluctuations present obstacles for achieving pico-Tesla per square-root sensitivity below 1 Hz.The fluctuations can be used as a probe of electrical transport and magnetization dynamics.
Keywords :
magnetic noise; magnetic sensors; magnetisation; magnetoresistive devices; current fluctuations; electrical transport; electronic noise; high-bandwidth applications; integrated noise power; magnetization dynamics; magnetization noise; magnetoresistive sensors; magnetoresistive systems; resistance fluctuations; shot noise; thermal noise; ultimate field sensitivity; voltage fluctuations; Electric resistance; Fluctuations; Frequency; Low-frequency noise; Magnetic sensors; Magnetization; Magnetoresistance; Measurement techniques; Probes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.375469
Filename :
4262436
Link To Document :
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