• DocumentCode
    2951008
  • Title

    Design and Development of a Uniplanar a 3-dB Hybrid Coupler for Microwave Integrated Circuit Applications

  • Author

    Raval, Falguni ; Dwivedi, Ved Vyas ; Kosta, Y.P. ; Makwana, M. Jagruti

  • Author_Institution
    Vitthalbhai T. Patel Dept. of Electron. & Commun. Eng., Charotar Inst. of Technol. Changa, Anand
  • fYear
    2008
  • fDate
    8-10 Dec. 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper presents the design of a uniplanar 3-dB hybrid coupler for microwave integrated circuits (MIC) and monolithic MIC (MMIC) applications. The same was developed and tested experimentally using a network analyzer in Sumeru Microwave Communication Lab. Its design and application issues have been widely discussed here with some standard data and graphs. The experimental results for the standard 1.5 lambda circumference uniplanar 180deg hybrid-ring coupler has been found in the standard accuracy range of 3.2 plusmn 0.4 dB coupling, isolation found is greater than 30-dB and the return loss better than 18.2-dB over a 2% bandwidth centered at 1.46 GHz. Also the experimental insertion loss found for this passive component is 0.5 dB at 1.46 GHz. The same has been concluded with its futuristic perspectives for research aspirants and microwave engineers.
  • Keywords
    MMIC; waveguide couplers; 3dB hybrid coupler; MMIC applications; Sumeru Microwave Communication Lab; frequency 1.46 GHz; loss 0.5 dB; microwave engineers; microwave integrated circuit applications; monolithic MIC applications; network analyzer; research aspirants; uniplanar design; Application specific integrated circuits; Bandwidth; Circuit testing; Coupling circuits; Hybrid integrated circuits; Insertion loss; MMICs; Microwave communication; Microwave integrated circuits; Monolithic integrated circuits; Coplanar strip lines; MIC; hybrid coupler; uniplanar circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial and Information Systems, 2008. ICIIS 2008. IEEE Region 10 and the Third international Conference on
  • Conference_Location
    Kharagpur
  • Print_ISBN
    978-1-4244-2806-9
  • Electronic_ISBN
    978-1-4244-2806-9
  • Type

    conf

  • DOI
    10.1109/ICIINFS.2008.4798336
  • Filename
    4798336