• DocumentCode
    2951606
  • Title

    Breakdown in compressed N2 under impulse voltages

  • Author

    Ismailoglu, H. ; Kalenderli, O. ; Ozkaya, M. ; Gonenc, I.

  • Author_Institution
    Fac. of Electr. & Electron., Istanbul Tech. Univ., Turkey
  • Volume
    2
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    604
  • Abstract
    Breakdown strength of N2 under standard lightning impulse voltages in non-uniform field was experimentally investigated. The experiments were carried out with sphere-plane electrode system with protrusion and without protrusion. The electrode gap spacing and the relative gas pressure were varied within the range of 5 mm to 25 mm and of 0 bar to 4 bars, respectively. At each pressure and gap spacing, impulse breakdown voltages for both negative and positive polarities were measured. The 50% breakdown values were obtained using the least squares. Breakdown voltage of N2 increases either with an increasing gap spacing and/or with an increasing gas pressure. Breakdown voltages of N2 in used electrode system under positive impulses, were higher than those of under negative impulses at small gap spacing; but much lower at greater gap spacing. In the experiments, breakdown voltages of sphere-plane with protrusion electrode system were found to be higher than those of sphere-plane electrode system under both polarities
  • Keywords
    electric breakdown; gaseous insulation; lightning; nitrogen; transients; 0 to 4 bar; 5 to 25 mm; N2; breakdown strength; compressed N2; gap spacing; gas pressure; least squares; lightning impulse voltage; nonuniform field; protrusion; sphere-plane electrode system; Bars; Breakdown voltage; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Gas insulation; Gases; Lightning; Nitrogen; Pressure measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    0-7803-3851-0
  • Type

    conf

  • DOI
    10.1109/CEIDP.1997.641147
  • Filename
    641147