Title :
Non-invasive Intracranial Pressure estimation using Support Vector Machine
Author :
Chacón, Max ; Pardo, Carlos ; Puppo, Corina ; Curilem, Millaray ; Landerretche, Jean
Author_Institution :
Inf. Eng. Dept., Univ. de Santiago de Chile (USACH), Santiago, Chile
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
Intracranial Pressure (ICP) measurements are of great importance for the diagnosis, monitoring and treatment of many vascular brain disturbances. The standard measurement of the ICP is performed invasively by the perforation of the cranial scalp in the presence of traumatic brain injury (TBI). Measuring the ICP in a noninvasive way is relevant for a great number of pathologies where the invasive measurement represents a high risk. The method proposed in this paper uses the Arterial Blood Pressure (ABP) and the Cerebral Blood Flow Velocity (CBFV) - which may be obtained by means of non-invasive methods - to estimate the ICP. A non-linear Support Vector Machine was used and reached a low error between the real ICP signal and the estimated one, allowing an on-line implementation of the ICP estimation, with an adequate temporal resolution.
Keywords :
blood flow measurement; blood pressure measurement; blood vessels; brain; feature extraction; medical signal processing; support vector machines; arterial blood pressure; cerebral blood flow velocity; cranial scalp perforation; feature extraction; noninvasive intracranial pressure estimation; nonlinear support vector machine; temporal resolution; traumatic brain injury; Arterial blood pressure; Estimation; Feature extraction; Iterative closest point algorithm; Mathematical model; Monitoring; Support vector machines; Algorithms; Artificial Intelligence; Blood Flow Velocity; Blood Pressure Determination; Cerebral Arteries; Diagnosis, Computer-Assisted; Humans; Intracranial Pressure; Manometry; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5627816