• DocumentCode
    2951906
  • Title

    A MEMS based sensor for large scale force measurement

  • Author

    Weihai Chen ; Jun Jiang ; Jingmeng Liu ; Wenjie Chen

  • Author_Institution
    Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
  • fYear
    2013
  • fDate
    9-12 July 2013
  • Firstpage
    1278
  • Lastpage
    1283
  • Abstract
    Recent advances on micro-engineering have accelerated the development of MEMS force sensors with large scale and high resolutions. To meet this demand, this paper presents the conceptual design of a new MEMS force sensor with dual-phase characteristics. In the first phase, the sensor possesses an ultra-high resolution that is enough for high precision force measurement. While in the second phase, the resolution is decreased, the measurement range is greatly improved such that the sensor can measure forces within large scale with high resolutions. This function is implemented through a specially designed compliant mechanism with carefully placed hard stoppers. The conceived force sensor features an SOI (Silicon-on-Insulator) body with an integrated capacitive sensor for displacement detecting. The obtained displacement signal is then converted to force information through a calibration procedure. This paper will first present the analytical modeling for both static stiffness and eigenfrequency of the sensor body. Then finite element simulations on both structural and electrical analysis will be demonstrated. Both the analytical and numerical results show that the proposed MEMS force sensor can measure forces ranging from nano-Newton to milli-Newton meanwhile keeps very fine resolutions.
  • Keywords
    calibration; finite element analysis; force measurement; force sensors; microsensors; silicon-on-insulator; MEMS force sensors; SOI body; calibration procedure; displacement signal; finite element simulations; force information; large scale force measurement; microengineering; silicon-on-insulator body; ultrahigh resolution; Capacitors; Force; Force measurement; Force sensors; Joints; Mathematical model; Micromechanical devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics (AIM), 2013 IEEE/ASME International Conference on
  • Conference_Location
    Wollongong, NSW
  • ISSN
    2159-6247
  • Print_ISBN
    978-1-4673-5319-9
  • Type

    conf

  • DOI
    10.1109/AIM.2013.6584270
  • Filename
    6584270