• DocumentCode
    2951956
  • Title

    High-Speed Metal-Semiconductor-Metal Photo diode

  • Author

    Ganguly, Amar K. ; Ganguly, Anshuman ; Bhoumic, M. ; Ganguly, Anshuman

  • Author_Institution
    Electron. & Commun. Eng. Dept., Asansol Eng. Coll., Asansol
  • fYear
    2008
  • fDate
    8-10 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    High speed resonant cavity metal-semiconductor-metal (MSM) Schottky barrier photo detector is reported. Nickel is used as metal and quasi mono-crystalline silicon (QMS) with nanovoids is used as semiconductor material. QMS is sandwiched between thin nickel plates to obtain heterodyne characterization of MSM photo detector. QMS of suitable dimension shows significant enhancement of optical absorptance which in turn provides higher efficiency of the photo detector. A theoretical model of the photo diode is designed with a resonant cavity. The resonant cavity is chosen for obtaining higher quantum efficiency and the Schottky effect provides high speed to this photo detector. The micro cavity also causes wavelength selectivity accompanied by a drastic increase of the electric field at the resonant wavelength. The enhanced optical field provides high efficiency for faster transit time limited photodiodes with thinner absorption region. Appreciable improvement in results on speed, efficiency and responsivity is observed.
  • Keywords
    Schottky barriers; Schottky diodes; metal-semiconductor-metal structures; nickel; photodetectors; photodiodes; silicon; Ni-Si-Ni; heterodyne characterization; metal-semiconductor-metal photodiode; quasi monocrystalline silicon; resonant cavity metal-semiconductor-metal Schottky barrier photodetector; wavelength selectivity; Detectors; High speed optical techniques; Nickel; Optical mixing; Resonance; Schottky barriers; Schottky diodes; Semiconductor diodes; Semiconductor materials; Silicon; Quantum efficiency; Quasi-mono-crystalline; Responsivity; Schottky barrier; absorptance; absorption coefficient; resonant cavity; silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial and Information Systems, 2008. ICIIS 2008. IEEE Region 10 and the Third international Conference on
  • Conference_Location
    Kharagpur
  • Print_ISBN
    978-1-4244-2806-9
  • Electronic_ISBN
    978-1-4244-2806-9
  • Type

    conf

  • DOI
    10.1109/ICIINFS.2008.4798383
  • Filename
    4798383