• DocumentCode
    2952719
  • Title

    Including inductive effects in interconnect timing analysis

  • Author

    Krauter, Byron ; Mehrotra, Sharad ; Chandramouli, V.

  • Author_Institution
    IBM Corp., Austin, TX, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    445
  • Lastpage
    452
  • Abstract
    Including inductive effects in interconnect timing analysis has become increasingly important in today´s deep submicron designs. In this tutorial paper we will describe the technology trends that brought us to this juncture, summarize when inductance should be included, and consider some of the extraction and modeling techniques available. This coverage will not be an exhaustive summary of all the extraction and analysis techniques available, but one that is primarily focused on extraction methods that efficiently capture frequency dependence due to proximity effects and moment-based analysis techniques
  • Keywords
    VLSI; circuit simulation; delay estimation; equivalent circuits; inductance; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; lumped parameter networks; method of moments; timing; VLSI; coupled RL circuit; deep submicron design; effective capacitance; extraction techniques; frequency dependence; gate delay; inductive effects; interconnect timing analysis; lumped circuit models; modeling techniques; moment-based analysis techniques; proximity effects; tutorial; Clocks; Delay effects; Frequency dependence; Impedance; Inductance; Integrated circuit interconnections; Propagation delay; RLC circuits; Timing; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits, 1999. Proceedings of the IEEE 1999
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-5443-5
  • Type

    conf

  • DOI
    10.1109/CICC.1999.777320
  • Filename
    777320