Title :
Distortion of fluorescence line profile due to laser radiation pressure in an RF trap
Author :
Hasegawa, T. ; Tanooka, D. ; Shimizu, T.
Author_Institution :
Dept. of Electron. & Comput. Sci., Sci. Univ. of Tokyo, Japan
Abstract :
Distortion of laser-induced fluorescence (LIF) spectral line profile of trapped Mg ions in an RF trap is observed and analyzed. It is found by establishing a theoretical model that collisions and laser radiation pressure induce the distortion. Furthermore, a new type line profile predicted by this model is observed.
Keywords :
fluorescence; laser cooling; magnesium; radiation pressure; spectral line breadth; trapped ions; /sup 24/Mg/sup +/ ions; Mg; RF trap; fluorescence line profile distortion; laser cooling; laser radiation pressure; laser-induced fluorescence; model; rate equation; shallow trap potential; trapped ions; Atom lasers; Atomic measurements; Distortion measurement; Electron traps; Fluorescence; Laser beams; Laser modes; Laser noise; Laser theory; Radio frequency;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699938
