Functional and catastrophic thermal failures in bipolar electronic circuits

Author

Górecki, Krzysztof ; Stepowicz, Witold J. ; Zarebsk, Janusz

Author_Institution

Dept. of Marine Electron., Gdynia Maritime Acad., Gdynia

fYear

2005

fDate

11-14 Dec. 2005

Firstpage

1

Lastpage

4

Abstract

In semiconductor devices interactions between electrical and thermal effects result from the selfheating phenomenon. Due to selfheating and non-ideal heat transfer from a device to surroundings, the junction (inside) temperature rise above the ambient temperature is observed, and as a result the form of the d.c. characteristics of devices can be essentially changed. This temperature rise can lead to functional failure of the circuit in which the device is used, or to catastrophic failure of the device. In the paper some examples of such circuits as the transistor switch and the differential pair are described.

Keywords

bipolar integrated circuits; bipolar transistor circuits; bipolar transistors; integrated circuit modelling; bipolar electronic circuits; bipolar transistor; catastrophic thermal failure; differential pair; functional failure; nonideal heat transfer; selfheating; semiconductor devices; transistor; Bipolar transistors; Circuit analysis computing; Electronic circuits; Electrothermal effects; Impedance; SPICE; Semiconductor devices; Switches; Temperature dependence; Thermal resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 2005. ICECS 2005. 12th IEEE International Conference on

Conference_Location

Gammarth

Print_ISBN

978-9972-61-100-1

Electronic_ISBN

978-9972-61-100-1

Type

conf

DOI

10.1109/ICECS.2005.4633593

Filename

4633593