Title :
Wavefront measurement using electro-optic scanning with a liquid-crystal SLM
Author :
Laude, V. ; Olivier, S. ; Dirson, C. ; Huignard, J.-P.
Author_Institution :
Corp. Res. Lab., Thomson-CSF, Orsay, France
Abstract :
Summary form only given. The developed wavefront sensor is based on the original Hartmann principle in which the aperture can be moved across the wavefront to analyze by an electro-optic programmable device. According to the operation principle the position of the diffraction pattern is measured on a CCD detector array at a distance d behind a lens of focal length f. If (x´,y´) is the measured position of the beam transmitted by the aperture moving on the SLM, the local wavefront slope at position (x,y) can be derived. This data is stored in a memory for each position of the sampling aperture displayed on the spatial light modulator (SLM) and which sequentially scans the wavefront.
Keywords :
CCD image sensors; electro-optical devices; liquid crystal devices; optical scanners; spatial light modulators; wavefront sensors; CCD detector array; diffraction pattern; electro-optic programmable device; electro-optic scanning; focal length; liquid-crystal SLM; local wavefront slope; operation principle; original Hartmann principle; sampling aperture; sequential wavefront scanning; spatial light modulator; wavefront measurement; wavefront sensor; Apertures; Charge coupled devices; Detectors; Diffraction; Electrooptic devices; Length measurement; Lenses; Position measurement; Sampling methods; Sensor arrays;
Conference_Titel :
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location :
Nice
Print_ISBN :
0-7803-6319-1
DOI :
10.1109/CLEOE.2000.910127