Title :
Considering layout for test scheduling of core-based SoCs
Author :
Xia, Yu ; Chrzanowska-Jeske, Malgorzata
Author_Institution :
Electr. & Comput. Eng., Portland State Univ., Portland, OR
Abstract :
We consider a test-scheduling problem, with layout constraints, for core-based SOCs. Individual cores have to be tested on a system level after manufacturing and therefore special test access mechanisms (TAMs) are required. The amount of additional wires needed to route TAMs depends strongly on a SOC layout. In this research, we investigate the SOC test-scheduling problem formulated as the bin-packing problem and constrained by a physical layout of a SOC. We solve the problem using evolutionary strategy and sequence-pair representation. Our results, for ITC´02 benchmarks, show that for most examples, our algorithm generates solutions with less interconnects.
Keywords :
integrated circuit layout; scheduling; system-on-chip; SOC layout; individual cores; system-on-chip; test access mechanisms; test scheduling; Design optimization; Evolutionary computation; Job shop scheduling; Logic testing; Manufacturing; Pins; Processor scheduling; Routing; System testing; Wires;
Conference_Titel :
Electronics, Circuits and Systems, 2005. ICECS 2005. 12th IEEE International Conference on
Conference_Location :
Gammarth
Print_ISBN :
978-9972-61-100-1
Electronic_ISBN :
978-9972-61-100-1
DOI :
10.1109/ICECS.2005.4633599