Title :
In vivo MRI study of the visual system in normal, developing and injured rodent brains
Author :
Chan, Kevin C. ; Cheung, Matthew M. ; Xing, Kyle K. ; Zhou, Iris Y. ; Chow, April M. ; Lau, Condon ; So, Kwok-fai ; Wu, Ed.X.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
This paper demonstrated our recent use of contrast-enhanced MRI, diffusion tensor/kurtosis imaging, proton magnetic resonance spectroscopy, and functional MRI techniques, for in vivo and global assessments of the structure, metabolism and function of the visual system in rodent studies of ocular diseases, optic neuropathies, developmental plasticity and neonatal hypoxic-ischemic brain injury at 7T. Results suggested the significant values of high-field multiparametric MRI for uncovering the processes and mechanisms of developmental and pathophysiological changes systematically along both anterior and posterior visual pathways, and may provide early diagnoses and therapeutic strategies for promoting functional recovery upon partial vision loss.
Keywords :
biomedical MRI; brain; injuries; neurophysiology; patient treatment; vision defects; contrast-enhanced MRI; developing rodent brain; diffusion tensor; in vivo MRI; injured rodent brain; kurtosis imaging; magnetic flux density 7 T; neonatal hypoxic-ischemic brain injury; ocular diseases; optic neuropathy; partial vision loss; plasticity; proton magnetic resonance spectroscopy; therapeutic strategy; visual system; Magnetic resonance imaging; Optical fiber sensors; Optical fibers; Optical imaging; Visualization; Animals; Animals, Newborn; Anisotropy; Brain; Contrast Media; Cricetinae; Diffusion Magnetic Resonance Imaging; Echo-Planar Imaging; Gadolinium; Magnetic Resonance Imaging; Manganese; Neuronal Plasticity; Optic Nerve; Oxygen; Photic Stimulation; Rats; Rodentia; Visual Cortex; Visual Pathways;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5627884