DocumentCode
2953157
Title
Hot air leveled tin: solderability and some related properties
Author
Haimovich, Joseph
Author_Institution
AMP Inc., Harrisburg, PA, USA
fYear
1989
fDate
22-24 May 1989
Firstpage
107
Lastpage
112
Abstract
Pure hot-air-leveled tin coatings on copper alloy substrates were stored at room temperature for up to four years and then tested for solderability. The solderability of these aged coatings was found to be very good. The intermetallic compound growth rates at lower temperatures were determined to be considerably lower than in electroplated tin coatings. This was attributed to the very large grain size of the tin layer. It was demonstrated that intermetallic growth is significant at the grain boundaries only, which accounts for the overall low growth rates. The whiskering tendency of hot-air-leveled coatings was assessed using tests designed to promote rapid whisker growth. No whiskers or whisker-related features were detected. The grain structure of hot-air-leveled tin, particularly the very large grain size, is the most likely reason for the absence of whiskers
Keywords
materials testing; printed circuit manufacture; reliability; soldering; tin; 4 yrs; Cu alloy substrate; aged coatings; electroplated tin coatings; grain boundaries; grain size; growth rates; hot-air-leveled tin coatings; intermetallic compound growth rates; rapid whisker growth; room temperature; solderability; Aging; Coatings; Computer vision; Copper alloys; Grain boundaries; Grain size; Intermetallic; Temperature; Testing; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location
Houston, TX
Type
conf
DOI
10.1109/ECC.1989.77735
Filename
77735
Link To Document