• DocumentCode
    2953157
  • Title

    Hot air leveled tin: solderability and some related properties

  • Author

    Haimovich, Joseph

  • Author_Institution
    AMP Inc., Harrisburg, PA, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    107
  • Lastpage
    112
  • Abstract
    Pure hot-air-leveled tin coatings on copper alloy substrates were stored at room temperature for up to four years and then tested for solderability. The solderability of these aged coatings was found to be very good. The intermetallic compound growth rates at lower temperatures were determined to be considerably lower than in electroplated tin coatings. This was attributed to the very large grain size of the tin layer. It was demonstrated that intermetallic growth is significant at the grain boundaries only, which accounts for the overall low growth rates. The whiskering tendency of hot-air-leveled coatings was assessed using tests designed to promote rapid whisker growth. No whiskers or whisker-related features were detected. The grain structure of hot-air-leveled tin, particularly the very large grain size, is the most likely reason for the absence of whiskers
  • Keywords
    materials testing; printed circuit manufacture; reliability; soldering; tin; 4 yrs; Cu alloy substrate; aged coatings; electroplated tin coatings; grain boundaries; grain size; growth rates; hot-air-leveled tin coatings; intermetallic compound growth rates; rapid whisker growth; room temperature; solderability; Aging; Coatings; Computer vision; Copper alloys; Grain boundaries; Grain size; Intermetallic; Temperature; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77735
  • Filename
    77735