DocumentCode :
2953161
Title :
A New Study on Distance Metrics as Similarity Measurement
Author :
Yu, Jie ; Amores, Jaume ; Sebe, Nicu ; Tian, Qi
Author_Institution :
Dept. of Comput. Sci., Texas Univ., San Antonio, TX
fYear :
2006
fDate :
9-12 July 2006
Firstpage :
533
Lastpage :
536
Abstract :
Distance metric is widely used in similarity estimation. In this paper we find that the most popular Euclidean and Manhattan distance may not be suitable for all data distributions. A general guideline to establish the relation between a distribution model and its corresponding similarity estimation is proposed. Based on maximum likelihood theory, we propose new distance metrics, such as harmonic distance and geometric distance. Because the feature elements may be from heterogeneous sources and usually have different influence on similarity estimation, it is inappropriate to model the distribution as isotropic. We propose a novel boosted distance metric that not only finds the best distance metric that fits the distribution of the underlying elements but also selects the most important feature elements with respect to similarity. The boosted distance metric is tested on fifteen benchmark data sets from the UCI repository and two image retrieval applications. In all the experiments, robust results are obtained based on the proposed methods
Keywords :
benchmark testing; image retrieval; maximum likelihood estimation; UCI dataset; benchmark testing; boosted distance metric; distribution model; image retrieval application; maximum likelihood theory; similarity estimation; Computer science; Content based retrieval; Euclidean distance; Feature extraction; Guidelines; Image retrieval; Information retrieval; Maximum likelihood estimation; Robustness; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo, 2006 IEEE International Conference on
Conference_Location :
Toronto, Ont.
Print_ISBN :
1-4244-0366-7
Electronic_ISBN :
1-4244-0367-7
Type :
conf
DOI :
10.1109/ICME.2006.262443
Filename :
4036654
Link To Document :
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