DocumentCode :
2953176
Title :
Integrated accelerometer with capacitance to digital interface circuit design based on monolithic 0.18μm CMOS MEMS technology
Author :
Chun-Chieh Wang ; Long-Sheng Fan ; Kuei-Ann Wen
Author_Institution :
Inst. of Electron., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
fYear :
2012
fDate :
28-31 Oct. 2012
Firstpage :
1
Lastpage :
4
Abstract :
A monolithic accelerometer with integrated capacitance to digital readout circuit implemented in mixed-signal MEMS process is proposed to demonstrate sensor-to-bit integration. The sensing range is from -5g to 5g and the variation of the capacitance is from 441.2fF to 470fF. The sensitivity of the accelerometer is 2.88fF/g. The capacitance value of the sensing range is readout by the capacitance to digital circuit to readout. The capacitance to time circuit of the sensitivity is 6.94us/pF which is equivalent to 20ns/1bit. The digital output can be obtained without analog to digital module, and thus with power saving advantage, the output signal can be directly interface to digital signal process.
Keywords :
accelerometers; capacitance; mixed analogue-digital integrated circuits; CMOS MEMS technology; digital interface circuit design; digital readout circuit; integrated accelerometer; integrated capacitance; mixed-signal MEMS process; monolithic accelerometer; sensor-to-bit integration; size 0.18 mum; Accelerometers; CMOS integrated circuits; Capacitance; Clocks; Integrated circuit modeling; Micromechanical devices; Sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2012 IEEE
Conference_Location :
Taipei
ISSN :
1930-0395
Print_ISBN :
978-1-4577-1766-6
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2012.6411551
Filename :
6411551
Link To Document :
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