• DocumentCode
    2953176
  • Title

    Integrated accelerometer with capacitance to digital interface circuit design based on monolithic 0.18μm CMOS MEMS technology

  • Author

    Chun-Chieh Wang ; Long-Sheng Fan ; Kuei-Ann Wen

  • Author_Institution
    Inst. of Electron., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
  • fYear
    2012
  • fDate
    28-31 Oct. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A monolithic accelerometer with integrated capacitance to digital readout circuit implemented in mixed-signal MEMS process is proposed to demonstrate sensor-to-bit integration. The sensing range is from -5g to 5g and the variation of the capacitance is from 441.2fF to 470fF. The sensitivity of the accelerometer is 2.88fF/g. The capacitance value of the sensing range is readout by the capacitance to digital circuit to readout. The capacitance to time circuit of the sensitivity is 6.94us/pF which is equivalent to 20ns/1bit. The digital output can be obtained without analog to digital module, and thus with power saving advantage, the output signal can be directly interface to digital signal process.
  • Keywords
    accelerometers; capacitance; mixed analogue-digital integrated circuits; CMOS MEMS technology; digital interface circuit design; digital readout circuit; integrated accelerometer; integrated capacitance; mixed-signal MEMS process; monolithic accelerometer; sensor-to-bit integration; size 0.18 mum; Accelerometers; CMOS integrated circuits; Capacitance; Clocks; Integrated circuit modeling; Micromechanical devices; Sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2012 IEEE
  • Conference_Location
    Taipei
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4577-1766-6
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2012.6411551
  • Filename
    6411551