• DocumentCode
    295327
  • Title

    Magneto-oscillations in the bipolar quantum-well resonant tunneling transistor

  • Author

    Clark, K.P. ; Bate, R.T. ; Kirk, W.P. ; Seabaugh, A.C. ; Kao, Y.C.

  • Author_Institution
    Center for Nanostructure Mater. & Quantum Device Fabrication, Texas A&M Univ., College Station, TX, USA
  • fYear
    1995
  • fDate
    7-9 Aug 1995
  • Firstpage
    475
  • Lastpage
    482
  • Abstract
    Magneto-oscillations due to a minority carrier two-dimensional electron gas (2DEG) in the base of a bipolar quantum-well resonant tunneling transistor at liquid helium temperatures are described. The 2DEG forms in a wide (20 nm) setback layer adjacent to an abrupt emitter/base heterojunction, often used in conventional HBTs as well as in the BiQuaRTT. The 2DEG has unusual capacitive effects at low temperature, since the sheet density increases to a maximum near 1012 /cm2 at flat-band conditions, then decreases at higher emitter/base bias. The high-mobility 2DEG accounts for the high lateral recombination, but may allow an effective reduction of base resistance, improving the high frequency response
  • Keywords
    Shubnikov-de Haas effect; cryogenic electronics; heterojunction bipolar transistors; minority carriers; resonant tunnelling transistors; semiconductor quantum wells; two-dimensional electron gas; 2DEG; 4.2 K; BiQuaRTT; Shubnikov-de Haas oscillations; abrupt emitter/base heterojunction; base resistance reduction; bipolar quantum-well resonant tunneling transistor; emitter/base bias; flat-band conditions; high frequency response; high lateral recombination; liquid helium temperature; magneto-oscillations; minority carrier two-dimensional electron gas; setback layer; sheet density; unusual capacitive effects; Electrons; Magnetic devices; Magnetic fields; Magnetic materials; Magnetic resonance; Nanostructured materials; Quantum well devices; Quantum wells; Resonant tunneling devices; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Speed Semiconductor Devices and Circuits, 1995. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
  • Conference_Location
    Ithaca, NY
  • ISSN
    1079-4700
  • Print_ISBN
    0-7803-3970-3
  • Type

    conf

  • DOI
    10.1109/CORNEL.1995.482543
  • Filename
    482543