DocumentCode
2953302
Title
Tunable laser diode ESPI for high precision in-plane rotation measurement
Author
Cornet, A. ; Nassim, A.K.
Author_Institution
Unite FYAM, Univ. Catholique de Louvain, Belgium
fYear
2000
fDate
10-15 Sept. 2000
Abstract
Summary form only given. We describe here an ESPI technique based on a carrier generation on the object by wavelength shifting of the emission of a laser diode. This technique generates reference fringes on the object. Tilting of the fringes can be used for high sensitivity measurement of the angular rotation of the object.
Keywords
angular measurement; electronic speckle pattern interferometry; laser tuning; measurement by laser beam; measurement errors; measurement uncertainty; semiconductor lasers; ESPI technique; angular rotation; carrier generation; high precision in-plane rotation measurement; high sensitivity measurement; reference fringes; tunable laser diode ESPI; wavelength shifting; Control systems; Diode lasers; Optical control; Rotation measurement; Stress control; Stress measurement; Temperature control; Thermal stresses; Tunable circuits and devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location
Nice
Print_ISBN
0-7803-6319-1
Type
conf
DOI
10.1109/CLEOE.2000.910145
Filename
910145
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