Title :
Tunable laser diode ESPI for high precision in-plane rotation measurement
Author :
Cornet, A. ; Nassim, A.K.
Author_Institution :
Unite FYAM, Univ. Catholique de Louvain, Belgium
Abstract :
Summary form only given. We describe here an ESPI technique based on a carrier generation on the object by wavelength shifting of the emission of a laser diode. This technique generates reference fringes on the object. Tilting of the fringes can be used for high sensitivity measurement of the angular rotation of the object.
Keywords :
angular measurement; electronic speckle pattern interferometry; laser tuning; measurement by laser beam; measurement errors; measurement uncertainty; semiconductor lasers; ESPI technique; angular rotation; carrier generation; high precision in-plane rotation measurement; high sensitivity measurement; reference fringes; tunable laser diode ESPI; wavelength shifting; Control systems; Diode lasers; Optical control; Rotation measurement; Stress control; Stress measurement; Temperature control; Thermal stresses; Tunable circuits and devices;
Conference_Titel :
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location :
Nice
Print_ISBN :
0-7803-6319-1
DOI :
10.1109/CLEOE.2000.910145
