Title :
Spatial resolution of nonlinear refractive index and third-order susceptibility measurements by Mach-Zehnder interferometry technique
Author :
Boudebs, Georges ; Dorkenou, K. ; Chis, M. ; Nguyen Phu, X.
Author_Institution :
Lab. des Proprietes Opt. des Mater. et Appl., Univ. d´Angers, France
Abstract :
Summary form only. The measurement technique we report here is based on using a Mach-Zehnder interferometer with pump-probe system. By doing so, the classical interference pattern used in Mach-Zehnder interferometer is modified by a pump beam introducing nonlinearities in the sample. The interference pattern at the output of the setup has been acquired on a CCD camera.
Keywords :
CCD image sensors; Fourier transform optics; Mach-Zehnder interferometers; light interferometry; nonlinear optical susceptibility; optical pumping; refractive index measurement; CCD camera; Mach-Zehnder interferometer; Mach-Zehnder interferometry technique; classical interference pattern; interference pattern; measurement technique; nonlinear refractive index; nonlinearities; pump beam; pump-probe system; spatial resolution; third-order susceptibility measurements; Cameras; Charge coupled devices; Fourier transforms; Frequency; Interference; Interferometry; Laser excitation; Pixel; Refractive index; Spatial resolution;
Conference_Titel :
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location :
Nice
Print_ISBN :
0-7803-6319-1
DOI :
10.1109/CLEOE.2000.910154
