Title :
Suggested triple-series connection measurement tests of the AC quantized Hall resistance and the AC longitudinal resistance
Author :
Cage, M.E. ; Jeffery, A. ; Elmquist, R.E.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Based on equivalent circuit calculations a single AC ratio bridge can be used to accurately determine the AC quantized Hall resistance and to provide an independent value of the AC longitudinal resistance in a quantum Hall device. This may be achieved by making quantized Hall resistance measurements for two different combinations of triple-series connections to a standards-quality device.
Keywords :
Hall effect devices; bridge circuits; electric resistance measurement; equivalent circuits; measurement standards; quantum Hall effect; 2DEG; AC longitudinal resistance; AC quantized Hall resistance; equivalent circuit calculations; quantum Hall device; resistance standard; single AC ratio bridge; triple-series connection measurement tests; Bridge circuits; Circuit testing; Electrical resistance measurement; Electrons; Equivalent circuits; Frequency measurement; Impedance measurement; Laboratories; Measurement standards; NIST;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699941
