DocumentCode
2953604
Title
The Study on the Test Generation Algorithm of Sequential Circuit
Author
Zhou Xun ; Wang Xiao Li ; Ren Rui
Author_Institution
Control Eng. Dept., Acad. of Armored Forces Engineerng, Beijing, China
fYear
2011
fDate
30-31 July 2011
Firstpage
1
Lastpage
2
Abstract
A kind of practical algorithm about the test generation of sequential circuit is introduced. The model and the framework are provided. The result of experiment indicated that the higher fault coverage can be obtained through the shorter test sequence by this algorithm.
Keywords
logic testing; sequential circuits; fault coverage; sequential circuit; test generation algorithm; test sequence; Circuit faults; Digital circuits; Fault diagnosis; Integrated circuit modeling; Optimization; Publishing; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Control, Automation and Systems Engineering (CASE), 2011 International Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4577-0859-6
Type
conf
DOI
10.1109/ICCASE.2011.5997641
Filename
5997641
Link To Document