Title :
The Study on the Test Generation Algorithm of Sequential Circuit
Author :
Zhou Xun ; Wang Xiao Li ; Ren Rui
Author_Institution :
Control Eng. Dept., Acad. of Armored Forces Engineerng, Beijing, China
Abstract :
A kind of practical algorithm about the test generation of sequential circuit is introduced. The model and the framework are provided. The result of experiment indicated that the higher fault coverage can be obtained through the shorter test sequence by this algorithm.
Keywords :
logic testing; sequential circuits; fault coverage; sequential circuit; test generation algorithm; test sequence; Circuit faults; Digital circuits; Fault diagnosis; Integrated circuit modeling; Optimization; Publishing; Sequential circuits;
Conference_Titel :
Control, Automation and Systems Engineering (CASE), 2011 International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-0859-6
DOI :
10.1109/ICCASE.2011.5997641
