Title :
Designing the best clock distribution network
Author :
Restle, P.J. ; Deutsch, A.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Clock distribution has become an increasingly challenging problem for VLSI designs, consuming an increasing fraction of resources such as wiring, power, and design time. Unwanted differences or uncertainties in clock network delays degrade performance or cause functional errors. Three dramatically different strategies being used in the VLSI industry to address these challenges are compared. Novel modeling and measurement techniques are used to investigate on-chip transmission-line effects that are important for high performance clock distribution networks.
Keywords :
VLSI; capacitance; delays; digital integrated circuits; integrated circuit design; timing circuits; VLSI designs; clock distribution network design; clock network delays; measurement techniques; modeling techniques; on-chip transmission-line effects; Clocks; Delay effects; Integrated circuit interconnections; Microprocessors; Network topology; Transmission lines; Uncertainty; Very large scale integration; Wires; Wiring;
Conference_Titel :
VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-4766-8
DOI :
10.1109/VLSIC.1998.687985