Title :
Non-precharged bit-line sensing scheme for high-speed low-power DRAMs
Author :
Kato, Y. ; Nakaya, N. ; Maeda, T. ; Higashiho, M. ; Yokoyama, T. ; Sugo, Y. ; Baba, F. ; Takemae, Y. ; Miyabo, T. ; Saito, S.
Author_Institution :
Fujitsu VLSI Ltd., Kasugai, Japan
Abstract :
Various proposals have been made and implemented for improving the bandwidth of the DRAM Input/Output interface. However, random access speed, which has limited DRAM total performance, has not been improved enough. Some proposals have been made to improve it, such as over-driving the power supply voltage for sense amplifiers, and amplifying the signal on bit-lines. These schemes, however, have suffered from increased power dissipation. This paper proposes a Non-Precharged Bit-line Sensing (NPBS) scheme in which data access is performed without precharging bit-lines. This realizes both an improvement of random access speed and a reduction of power dissipation. Also, we propose a power reduction scheme for the memory system named Initial Same Data Write (ISDW). In combination with the NPBS, the power is effectively reduced when part of a memory system is not used.
Keywords :
CMOS memory circuits; DRAM chips; VLSI; high-speed integrated circuits; 0.28 micron; 30 ns; 512 Kbit; CMOS process; dynamic RAM; high-speed DRAMs; initial same data write; low-power DRAM; nonprecharged bit-line sensing scheme; power dissipation reduction; random access speed improvement; Capacitance; Capacitors; Equations; MOS devices; Operational amplifiers; Power dissipation; Proposals; Random access memory; Very large scale integration; Voltage;
Conference_Titel :
VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-4766-8
DOI :
10.1109/VLSIC.1998.687988