DocumentCode :
2953856
Title :
Fast cycle RAM (FCRAM); a 20-ns random row access, pipe-lined operating DRAM
Author :
Sato, Y. ; Suzuki, T. ; Aikawa, T. ; Fujioka, S. ; Fujieda, W. ; Kobayashi, H. ; Ikeda, H. ; Nagasawa, T. ; Funyu, A. ; Fuji, Y. ; Kawasaki, K. ; Yamazaki, M. ; Taguchi, M.
Author_Institution :
Fujitsu Labs. Ltd., Kawasaki, Japan
fYear :
1998
fDate :
11-13 June 1998
Firstpage :
22
Lastpage :
25
Abstract :
We propose an ultra-high speed 64-Mbit DRAM, with a random address access time (tRAC) of 26 ns and an address cycle time (tRC) of 20 ns. This memory was built on fundamental changes in the operating concept of DRAMs. The key technologies are described below. (1) Non-address multiplex: this enables minimization of timing lag between the row side and the column side circuitry by adding a timing generator to the chip. This is unlike usual DRAMs in which timings are controlled externally by a CAS clock. The activated block size can be much smaller than usual. Sensing and restore functions are performed by separate circuits, allowing for a minimum delay in the data path. (2) Pipelined operation in RAS circuitry: the DRAM core automatically goes into a reset state after sense/restore operation. After sending data to the output stage, the next row or word line can be driven without any time lag, while the previous data is in the output stage. As a result, the next address can be applied in 20 ns, even for the same bank. Data I/O of this RAM is comprised of a 64-bit parallel port, resulting in 3.2 Gb/s bandwidth even in the random address access mode.
Keywords :
CMOS memory circuits; DRAM chips; pipeline processing; very high speed integrated circuits; 0.24 micron; 20 ns; 26 ns; 400 MHz; 64 Mbit; RAS circuitry; fast cycle RAM; nonaddress multiplex; pipelined operating DRAM; random row access; reset state; restore functions; sense/restore operation; sensing functions; timing generator; ultra-high speed operation; Automatic control; Bandwidth; Circuits; Clocks; Content addressable storage; Delay; Minimization; Random access memory; Read-write memory; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-4766-8
Type :
conf
DOI :
10.1109/VLSIC.1998.687990
Filename :
687990
Link To Document :
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