Title :
Tree parity machine-based One-Time Password authentication schemes
Author :
Chen, Tieming ; Huang, Samuel H.
Author_Institution :
Coll. of Software Eng., Zhejiang Univ. of Technol., Hangzhou
Abstract :
One-time password (OTP) is always used as the strongest authentication scheme among all password-based solutions. Currently, consumer devices such as smart card have implemented OTP based two-factor authentications for secure access controls. Such solutions are economically sound without support of timestamp mechanisms. Therefore, synchronization of internal parameters in OTP models, such as moving factor or counter, between the client and server is the key challenge. Recently, a novel phenomenon shows that two interacting neural networks, called Tree Parity Machines (TPM), with common inputs can finally synchronize their weight vectors through finite steps of output-based mutual learning. The improved secure TPM can well be utilized to synchronize parameters for OTP schemes. In this paper, TPM mutual learning scheme is introduced, then two TPM-based novel OTP solutions are proposed. One is a full implementation model including initialization and rekeying, while the other is light-weight and efficient suitable for resource-constrained embedded environment. Security and performance on the proposed protocols are at final discussed.
Keywords :
authorisation; client-server systems; learning (artificial intelligence); message authentication; neural nets; access control; client-server system; consumer device; internal parameter synchronization; neural network; one-time password authentication scheme; tree parity machine mutual learning scheme; weight vector; Access control; Authentication; Counting circuits; Environmental economics; Machine learning; Network servers; Neural networks; Protocols; Security; Smart cards;
Conference_Titel :
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-1820-6
Electronic_ISBN :
1098-7576
DOI :
10.1109/IJCNN.2008.4633799