• DocumentCode
    2954083
  • Title

    Feature extraction using surrounding-line integral bispectrum for radar emitter signal

  • Author

    Chen, Tao-Wei ; Jin, Wei-dong ; Li, Jie

  • Author_Institution
    Sch. of Inf. Sci.&Technol., Southwest Jiaotong Univ., Chendu
  • fYear
    2008
  • fDate
    1-8 June 2008
  • Firstpage
    294
  • Lastpage
    298
  • Abstract
    In everchanging threat emitter environment, specific emitter identification (SEI) technology extracts subtle but persistent features from received pulse signal to create a fingerprint unique to a specific radar. Unlike conventional five parameters deinterleaving algorithm, which can be grossly ambiguous for radar emitter sorting, the SEI technology provides hardware specific identification. In this paper, we propose an approach for extracting unintentional phase modulation features caused by oscillator based on surrounding-line integral bispectrum. The quantitative features, i.e. bispectra entropy, waveform entropy and mean of surrounding-line integrated bispectra, is extracted using entropy-like function to reveal the subtle difference between emitters. Computer simulations show that how the phase-noise-induced signal changes analysis based on bispectrum approach can be used to determine which of emitters transmitted a pulse signal.
  • Keywords
    entropy; feature extraction; phase modulation; radar signal processing; spectral analysis; bispectra entropy; computer simulation; deinterleaving algorithm; hardware specific identification; radar emitter signal; radar emitter sorting technology; received pulse signal; specific emitter identification technology; surrounding-line integral bispectrum; unintentional phase modulation feature extraction; waveform entropy; Computer simulation; Entropy; Feature extraction; Fingerprint recognition; Hardware; Oscillators; Phase modulation; Radar; Signal processing; Sorting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1098-7576
  • Print_ISBN
    978-1-4244-1820-6
  • Electronic_ISBN
    1098-7576
  • Type

    conf

  • DOI
    10.1109/IJCNN.2008.4633806
  • Filename
    4633806