DocumentCode :
2954083
Title :
Feature extraction using surrounding-line integral bispectrum for radar emitter signal
Author :
Chen, Tao-Wei ; Jin, Wei-dong ; Li, Jie
Author_Institution :
Sch. of Inf. Sci.&Technol., Southwest Jiaotong Univ., Chendu
fYear :
2008
fDate :
1-8 June 2008
Firstpage :
294
Lastpage :
298
Abstract :
In everchanging threat emitter environment, specific emitter identification (SEI) technology extracts subtle but persistent features from received pulse signal to create a fingerprint unique to a specific radar. Unlike conventional five parameters deinterleaving algorithm, which can be grossly ambiguous for radar emitter sorting, the SEI technology provides hardware specific identification. In this paper, we propose an approach for extracting unintentional phase modulation features caused by oscillator based on surrounding-line integral bispectrum. The quantitative features, i.e. bispectra entropy, waveform entropy and mean of surrounding-line integrated bispectra, is extracted using entropy-like function to reveal the subtle difference between emitters. Computer simulations show that how the phase-noise-induced signal changes analysis based on bispectrum approach can be used to determine which of emitters transmitted a pulse signal.
Keywords :
entropy; feature extraction; phase modulation; radar signal processing; spectral analysis; bispectra entropy; computer simulation; deinterleaving algorithm; hardware specific identification; radar emitter signal; radar emitter sorting technology; received pulse signal; specific emitter identification technology; surrounding-line integral bispectrum; unintentional phase modulation feature extraction; waveform entropy; Computer simulation; Entropy; Feature extraction; Fingerprint recognition; Hardware; Oscillators; Phase modulation; Radar; Signal processing; Sorting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location :
Hong Kong
ISSN :
1098-7576
Print_ISBN :
978-1-4244-1820-6
Electronic_ISBN :
1098-7576
Type :
conf
DOI :
10.1109/IJCNN.2008.4633806
Filename :
4633806
Link To Document :
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