• DocumentCode
    2954341
  • Title

    COTS based high data throughput acquisition system for a real-time reflectometry diagnostic

  • Author

    Santos, J. ; Zilker, M. ; Treutterer, W. ; Amador, C. ; Guimarãis, L. ; Manso, M.

  • Author_Institution
    Lab. Associado, Associacao EURATOM/IST, Lisbon, Portugal
  • fYear
    2010
  • fDate
    24-28 May 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Achieving higher levels of plasma performance control in present fusion experiments requires that diagnostics be upgraded to deliver processed physical parameters in real-time (RT). A key element in a diagnostic RT upgrade is the data acquisition system (DAS), that should be capable of delivering the acquired data to the data processing resources with very low latencies and in the shortest possible time. Adequate standard commercial solutions with these characteristics are not easily found in the market, what leads most of the times to the development of complex custom high-performance designs from ground-up. A mixed solution, partially based on commercial off-the-shelf (COTS) components, is under development to upgrade the existing ASDEX Upgrade (AUG) broadband reflectometry diagnostic so that a full demonstration of plasma position control using RT reflectometry density profile measurements can be performed. The 8-channel (12-bit/100 MSPS) DAS being designed features a PCI Express (PCIe) x8 interface to enable direct memory access (DMA) data transfers with throughputs in excess of 1 GB/s. The use of COTS components resulted in a faster hardware design cycle without compromising system performance and flexibility. The architecture of the system and its main design constraints as well as the system integration in the AUG RT diagnostic network are herein discussed. Preliminary benchmark results for data throughput and overall measurement latency are also presented.
  • Keywords
    data acquisition; electronic data interchange; file organisation; parallel processing; peripheral interfaces; position control; real-time systems; reflectometry; ASDEX Upgrade broadband reflectometry; COTS; PCI Express; commercial off-the-shelf components; complex custom high-performance designs; data acquisition system; data processing resources; direct memory access; hardware design; plasma performance control; plasma position control; real-time reflectometry diagnostic; system architecture; Data processing; Field programmable gate arrays; Hardware; Phase locked loops; Position control; Random access memory; Synchronization; COTS; Data acquisition; FPGA; high throughput; real-time diagnostics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Real Time Conference (RT), 2010 17th IEEE-NPSS
  • Conference_Location
    Lisbon
  • Print_ISBN
    978-1-4244-7108-9
  • Type

    conf

  • DOI
    10.1109/RTC.2010.5750399
  • Filename
    5750399