DocumentCode
2954805
Title
Quantifying electrode position effects in EEG data with Lempel-Ziv complexity
Author
De Sousa Silva, Ana Carolina ; Arce, Aldo Ivan Céspedes ; Tech, Adriano Rogério Bruno ; Costa, Ernane José Xavier
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
4002
Lastpage
4005
Abstract
Complexity measurement using Lempel and Ziv algorithm (LZ) has been used to analyze physiological data. This work shows that the Lempel and Ziv complexity measurement of EEG signals using wavelets transforms is independent of electrode position and dependent on cognitive tasks and brain activity. EEG database with 122 subjects from the public EEG dataset was used in this study. This database have spontaneous EEG and evoked potential (EP) data from a 64-multielectrode array under a variety of conditions collected at several centers in the United States, sponsored by the National Institute on Alcohol Abuse and Alcoholism (NIAAA) project. Two experiments were performed with this database. The first experiment was to test the dependency of electrode positions into LZ complexity measures and the second experiment was to analyze if the LZ complexity was sensitive to the EEG acquired from control and alcoholic subjects. The results show that the complexity measurement is dependent on the changes of the pattern of brain dynamics and not dependent on electrode position.
Keywords
biomedical electrodes; brain; cognition; data compression; electroencephalography; medical signal processing; wavelet transforms; EEG; Lempel-Ziv complexity; brain activity; brain dynamics; cognitive tasks; electrode position effects; evoked potential; multielectrode array; wavelet transforms; Brain; Complexity theory; Electrodes; Electroencephalography; Position measurement; Wavelet transforms; Algorithm; Brain signals; EEG Models; Wavelets; Algorithms; Electrodes; Electroencephalography; Evoked Potentials; Humans;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5628002
Filename
5628002
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