DocumentCode :
295487
Title :
Adaptive erasure generation for coded frequency-hop communications with partial-band interference and fading
Author :
Baum, Carl W. ; Daraiseh, Abdelghani A. ; Balakrishnan, Krishnan
Author_Institution :
Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
Volume :
1
fYear :
1995
fDate :
35009
Firstpage :
315
Abstract :
The erasure of unreliable symbols can significantly improve the performance of frequency-hop communication systems. In this paper, Bayesian decision theory and parameter estimation techniques are used to decide which symbols to erase. Erasure decisions are made by combining the envelope detector outputs into statistics that estimate signal-to-noise ratios and symbol reliabilities. With these techniques, no a priori channel information is needed and no test symbols are required. The performance of these techniques in frequency hop systems with Reed-Solomon coding is determined for channels with partial band interference, fading and wideband noise. This system provides performance comparable to the theoretical performance that would be obtained if perfect a priori channel information were present. In addition, performance is much superior to that obtained by errors-only decoding
Keywords :
Bayes methods; Reed-Solomon codes; adaptive codes; decision theory; fading; frequency hop communication; interference (signal); parameter estimation; statistical analysis; telecommunication channels; Bayesian decision theory; Reed-Solomon coding; adaptive erasure generation; coded frequency-hop communications; envelope detector outputs; fading; parameter estimation techniques; partial-band interference; performance; signal-to-noise ratios; statistics; symbol reliabilities; unreliable symbols; wideband noise; Bayesian methods; Communication systems; Decision theory; Envelope detectors; Frequency; Parameter estimation; Reed-Solomon codes; Signal to noise ratio; Statistics; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 1995. MILCOM '95, Conference Record, IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-2489-7
Type :
conf
DOI :
10.1109/MILCOM.1995.483379
Filename :
483379
Link To Document :
بازگشت