Title :
Evaluation of the sleep quality based on bed sensor signals: Time-variant analysis
Author :
Mendez, Martin O. ; Migliorini, Matteo ; Kortelainen, Juha M. ; Nisticó, Domenino ; Arce-Santana, Edgar ; Cerutti, Sergio ; Bianchi, Anna M.
Author_Institution :
Fac. de Cienc., Univ. Autonoma de San Luis Potosi, San Luis Potosi, Mexico
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
Automatic detection of the sleep macrostructure (Wake, NREM -non Rapid Eye Movement- and REM-Rapid Eye Movement-) based on bed sensor signals is presented. This study assesses the feasibility of different methodologies to evaluate the sleep quality out of sleep centers. The study compares a) the features extracted from time-variant autoregressive modeling (TVAM) and Wavelet Decomposition (WD) and b) the performance of K-Nearest Neighbor (KNN) and Feed Forward Neural Networks (FFNN) classifiers. In the current analysis, 17 full polysomnography recordings from healthy subjects were used. The best agreement for Wake-NREM-REM with respect to the gold standard was 71.95 ± 7.47% of accuracy and 0.42 ± 0.10 of kappa index for TVAM-LD while WD-FFNN shows 67.17 ± 11.88% of accuracy and 0.39 ± 0.13 of kappa index. The results suggest that the sleep quality assessment out of sleep centers could be possible and as consequence more people could be beneficiated.
Keywords :
bioelectric phenomena; biomedical measurement; feedforward neural nets; medical signal processing; neurophysiology; signal classification; sleep; K-Nearest neighbor classifiers; NREM; REM; bed sensor signals; feedforward neural networks classifiers; full polysomnography recordings; non rapid eye movement; rapid eye movement; sleep macrostructure; sleep quality; time-variant analysis; time-variant autoregressive modeling; wake; wavelet decomposition; Accuracy; Feature extraction; Heart rate variability; Indexes; Monitoring; Pathology; Sleep; Automation; Feasibility Studies; Humans; Polysomnography; Sleep;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5628005