DocumentCode :
2954998
Title :
Automated on-chip burn-in system for TAB reels
Author :
Shreeve, Robert W.
Author_Institution :
Hewlett Packard, Corvallis, OR, USA
fYear :
1989
fDate :
22-24 May 1989
Firstpage :
187
Lastpage :
189
Abstract :
A tape automated bonding (TAB) burn-in on reel system is discussed. This system has demonstrated its ability to produce significant cost advantages over singulated TAB carrier burn-in systems. The cost advantages result from the elimination of burn-in boards, higher burn-in process yields, and reduced part load/unload times. The costs for reliability testing have also decreased because of design, purchase, and debug of long-term life and moisture resistance boards is no longer required. The elimination of reliability test hardware allows larger sample sizes to be used for product reliability qualifications. Hence, higher part quality and reliability can be obtained
Keywords :
automatic testing; circuit reliability; environmental testing; integrated circuit testing; production testing; quality control; surface mount technology; SMT; TAB reels; cost advantages; larger sample sizes; on chip burn-in reel system; product reliability qualifications; reliability testing costs; singulated TAB carrier burn-in systems; surface mounted devices; tape automated bonding; Circuit testing; Costs; Manufacturing processes; Ovens; Packaging; Signal processing; Sockets; System testing; System-on-a-chip; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location :
Houston, TX
Type :
conf
DOI :
10.1109/ECC.1989.77748
Filename :
77748
Link To Document :
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