• DocumentCode
    2955088
  • Title

    Wavelength-selective components in SOI photonic wires fabricated with deep UV lithography

  • Author

    Dumon, Pieter ; Bogaerts, Wim ; Van Thourhout, Dries ; Taillaert, D. ; Wiaux, Vincent ; Beckx, Stephan ; Wouters, Johan ; Baets, Roel

  • Author_Institution
    Ghent Univ., Gent, Belgium
  • fYear
    2004
  • fDate
    29 Sept.-1 Oct. 2004
  • Firstpage
    28
  • Lastpage
    30
  • Abstract
    We demonstrate both ring resonator drop filters and arrayed waveguide gratings in silicon-on-insulator photonic wires. The structures are fabricated in a CMOS line using deep UV lithography and dry etching processes. Waveguide losses are as low as 2.4 dB/cm for a 500 nm wide photonic wire, with excess bend losses of 0.03 dB/90° in a 3 μm bend. Using grating fiber couplers for measurements, we show ring and racetrack resonators with a Q up to 12700 and an 8-channel arrayed waveguide grating with a footprint of about 0.1 mm2, 3 nm channel spacing and -6 dB crosstalk between channels.
  • Keywords
    CMOS integrated circuits; Q-factor; arrayed waveguide gratings; channel spacing; etching; integrated optics; optical crosstalk; optical fabrication; optical fibre communication; optical fibre couplers; optical filters; optical losses; optical resonators; silicon-on-insulator; ultraviolet lithography; waveguide discontinuities; 3 mum; 500 nm; CMOS line; Q-factor; SOI photonic wires; Si; arrayed waveguide gratings; bend losses; channel spacing; deep UV lithography; dry etching; grating fiber couplers; optical crosstalk; optical fibre communication; photonic wire fabrication; racetrack resonator; ring resonator; ring resonator drop filters; silicon-on-insulator; waveguide losses; wavelength-selective components; Arrayed waveguide gratings; CMOS process; Dry etching; Fiber gratings; Lithography; Optical losses; Optical ring resonators; Resonator filters; Silicon on insulator technology; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics, 2004. First IEEE International Conference on
  • Print_ISBN
    0-7803-8474-1
  • Type

    conf

  • DOI
    10.1109/GROUP4.2004.1416642
  • Filename
    1416642