• DocumentCode
    2955334
  • Title

    Metrological analysis of a high current measurement system

  • Author

    Prat, M. ; Desanlis, T.

  • Author_Institution
    CEA, Polygone d´Exp. de Moronvilliers, Pontfaverger, France
  • fYear
    1998
  • fDate
    6-10 July 1998
  • Firstpage
    361
  • Lastpage
    362
  • Abstract
    This paper presents a study about a high current measurement system. This system is used to measure a high pulsed current with precision. A metrological analysis was begun to determine the real precision and the limitations of this system. In the first part of the paper, the measurement principle, based on the inductive effect, is presented. In the second part, the metrological process is presented and the reasons of this analysis are explained. The main limitations of this system are described in the third part. These main limitations depend on the current probe positions and the choice of the numerical algorithm used to analyse the recorded electrical signals. Finally, we can measure a six megaamperes pulsed current with a precision of /spl plusmn/5% in using this metrological study and a new calibration of the system.
  • Keywords
    calibration; electric current measurement; calibration; current probe; electrical signal; inductive effect; metrological analysis; numerical algorithm; pulsed current measurement system; Calibration; Current measurement; Magnetic field measurement; Oscilloscopes; Probes; Pulse generation; Pulse measurements; Signal analysis; Signal generators; Signal processing algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1998 Conference on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-5018-9
  • Type

    conf

  • DOI
    10.1109/CPEM.1998.699951
  • Filename
    699951