Title :
MMIC process for integrated power converters
Author :
Pereira, Antonio ; Albahrani, Sayed ; Parker, Anthony ; Town, Graham ; Heimlich, Michael
Author_Institution :
Dept. of Electron. Eng., Macquarie Univ., Sydney, NSW, Australia
Abstract :
Commercial RF MMIC fabrication process technologies were investigated for fabrication of integrated switching power converters. Pulsed IV characterization of GaN FETs revealed ON resistance dependence on off state bias, and current collapse at high temperatures. The degradation in ON resistance and current collapse can severely impact the efficiency of switching circuits fabricated in these processes.
Keywords :
III-V semiconductors; MMIC; gallium compounds; power convertors; radiofrequency integrated circuits; switching circuits; wide band gap semiconductors; GaN; ON resistance dependence; RF MMIC fabrication process technologies; current collapse; integrated switching power converters; off state bias; pulsed IV characterization; Field effect transistors; Gallium arsenide; Gallium nitride; MMICs; Resistance; Switches; Temperature measurement;
Conference_Titel :
TENCON Spring Conference, 2013 IEEE
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4673-6347-1
DOI :
10.1109/TENCONSpring.2013.6584455
