Title :
All-optoelectronic solutions for process tomography
Author :
Ozanyan, K.B. ; Carey, S.J. ; Hindle, F. ; McCann, H. ; Winterbone, D.E. ; Young, S.W. ; Black, J.
Author_Institution :
Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK
Abstract :
Summary form only given. A variety of industrial processes would be enhanced by using appropriate imaging systems, capable of precise monitoring of the spatial distribution of species that are responsible for the underlying process (chemical reactions, multi-phase flows, etc.). Such systems can be an important step in building a closed-loop feedback system for automated control. The image refresh rate is a critical parameter for applications where timing is crucial, hence the necessity to develop optical and other tomographic techniques that allow a high sampling frequency. Furthermore, for a field-deployable optical tomographic system, an all-optoelectronic solution (AOES) is desirable for portability, compactness, light weight, low power consumption and low-maintenance. An AOES can offer application-specific spectral selectivity, thus enabling tomography of a particular chemical species.
Keywords :
chemical analysis; chemical variables measurement; fibre optic sensors; optical images; optical tomography; optoelectronic devices; all-optoelectronic solution; all-optoelectronic solutions; application-specific spectral selectivity; automated control; chemical reactions; chemical species; closed-loop feedback system; compactness; critical parameter; field-deployable optical tomographic system; high sampling frequency; image refresh rate; imaging systems; industrial processes; light weight; low power consumption; low-maintenance; multi-phase flows; optical techniques; portability; precise monitoring; process tomography; spatial distribution; timing; tomographic techniques; tomography; Automatic control; Chemical industry; Chemical processes; Control systems; Electrical equipment industry; Monitoring; Optical feedback; Optical imaging; Timing; Tomography;
Conference_Titel :
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location :
Nice
Print_ISBN :
0-7803-6319-1
DOI :
10.1109/CLEOE.2000.910296