Title :
New ATPG algorithm for iDDT-based testing
Author :
Chehab, Ali ; Makki, Rafic ; Maddali, Raghudar
Author_Institution :
Dept. of Electr. & Comput. Eng., American Univ. of Beirut, Lebanon
Abstract :
In this paper we present a new ATPG algorithm and its software implementation for the automatic generation of input vector pairs specific for iDDT-based test methods. The algorithm attempts to switch every net in the circuit, to minimize the total number of required test vectors and to minimize the switching activity in he circuit. We present the results of the application of the ATPG to the ISCAS´85 benchmark circuits and show the switching profiles of the benchmark circuits.
Keywords :
algorithm theory; automatic test pattern generation; benchmark testing; integrated circuit testing; ATPG algorithm; IDDT-based testing; automatic generation; benchmark circuits; circuit switching activity; input vector pairs; software implementation; switching profiles; test vectors; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Costs; Integrated circuit interconnections; Manufacturing; Semiconductor device testing; Switches; Switching circuits;
Conference_Titel :
Microelectronics, The 14th International Conference on 2002 - ICM
Print_ISBN :
0-7803-7573-4
DOI :
10.1109/ICM-02.2002.1161535
