Title :
TTTC: Test Technology Technical Council
Abstract :
Provides a listing of current committee members and society officers.
Keywords :
Art; Conferences; Electronic equipment testing; Logic design; Logic testing; Meetings; System testing; Technical Councils; Technical activities; USA Councils;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-0-7695-3839-6
DOI :
10.1109/DFT.2009.60
